| Hi, just a reminder that you're receiving this email because you have expressed an interest in IEEE TTTC Office. Don't forget to add ebs@ieee-tttc.org to your address book so we'll be sure to land in your inbox! You may unsubscribe if you no longer wish to receive our emails. |
 |
TTTC's Electronic Broadcasting Service |
37th IEEE VLSI Test Symposium 2019 (VTS19) http://tttc-vts.org/public_html/new/2019/ |
REGISTRATION DEADLINE APPROACHING!!!!
|
|
| CALL FOR PARTICIPATION |
|
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, reliability and security of microelectronic circuits and systems. |
|
| The VTS 2019 program starts with a keynote address from Abhinav Kandala, who is a member of the experimental quantum computing group at the IBM T.J. Watson Research Center. He will share the "challenges in design and test of superconducting quantum technology at IBM". This will be followed by an invited keynote address by Professor Patrick Groeneveld from Stanford University on “Secure and Reliable Automotive Drivetrains”. The core of VTS 2019, the three days technical program, responds to the many trends and challenges in the semiconductor design and manufacturing industries, with papers and presentations in the research paper sessions covering the core set of test topics: Analog, Mixed-Signal; Hardware Security and Trust; Design Verification, Validation and Diagnosis; Delay & Performance Test; Test ATPG & Compression; On-Line Test & Error Correction; Embedded Systems & Board Test; Learning Based Diagnosis, Test and Security; Test Standards and Scan Test; Structural and Cell Aware Test; 2.5D, 3D and SiP Test. In the framework of a new partnership with the China Test Conference (CTC) a session is dedicated to the presentation of three CTC best papers. VTS also hosts the E.J. McCluskey Doctoral Thesis Competition to showcase the exciting student research spanning all of the above topics. VTS also continues its tradition of drawing the leading test practitioners and researchers in both industry and academia to contribute to the innovative practices (IP), special sessions, and new topic sessions, enabling it to be the venue where future technology trends and test challenges are debated, test practices are shared, and test research roadmaps are charted. In particular, this year’s program features the intersection of test, reliability, security, and Artificial Intelligence in many emerging and neighboring topics, in order to stimulate discussions and exchange of ideas beyond the traditional test community. We have a rich offering of diverse topics in the IP and special sessions: Countering IP Security Threats in Supply Chain; Quality and Reliability Driven DFT and DFR Strategy for Automotive and Industrial Markets; Photonic IC Testing; Functional Test in Automotive; Delay Fault Testing; Reliability of Hardware-Implemented Spiking Neural Networks; Approximate Computing; IEEE 1687.xyz; DFT for AI Chips; Design for Test in State-of-the-Art Analog Systems; Machine Learning Applications in IC Test-Related Tasks; Cybersecurity; Software and Hardware based Silicon Debug / Fault Isolation; In-system Test and Reliability of Memories. Two new topic sessions are offered with focus on Photonic IC Testing and Emerging Computing and Testing Techniques. The highly popular first day evening Wine-and-Cheese Panel discusses a number of issues in the emerging and inter-disciplinary field of AI-powered Security Validation and Test. The social program at VTS provides an opportunity for informal technical discussions among participants. |
|
Advance registrations are accepted until April 15, 2019 through the VTS website: Hotel reservation is possible here: |
|
| Additional Information | |
For further information, please, contact: General chair: Peilin Song (IBM Research) Email: psong@us.ibm.com
|
|
| Committee | |
|
|
|
| For more information, visit us on the web at: http://www.tttc-vts.org |
|
The 37th IEEE VLSI Test Symposium 2019 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
|
IEEE
Computer Society-Test Technology Technical Council |
||
TTTC CHAIR
PAST CHAIR
TTTC 1ST VICE CHAIR
SECRETARY TEST WEEK COORDINATOR TUTORIALS AND EDUCATION STANDARDS EUROPE MIDDLE EAST & AFRICA STANDING COMMITTEES ELECTRONIC MEDIA |
PRESIDENT OF BOARD SENIOR PAST CHAIR TTTC 2ND VICE CHAIR FINANCE TECHNICAL MEETINGS TECHNICAL ACTIVITIES ASIA & PACIFIC LATIN AMERICA NORTH AMERICA COMMUNICATIONS INDUSTRY ADVISORY BOARD |
|
This message contains public information only. You are invited to copy and distribute it further. For more information contact the TTTC office or visit http://tab.computer.org/tttc/ To remove or modify your contact information, or to register new users, please click here and follow the on-line instructions. |